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JEOL USA Press Releases

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Full Circumference Wafer Edge Review SEM at Semicon West 2006
Peabody, Mass., May 19, 2006 --  JEOL, the industry-leading manufacturer of high resolution Scanning Electron Microscopes (SEMs), will showcase its automated, 360 degree wafer edge review SEM in Booth 1101 in the South Hall at Semicon West 2006, Moscone Center, San Francisco. The JEOL JWS-2000 (200mm) and JWS-3000 (200/300mm) are the only wafer edge review SEMs that allow pinpoint inspection at any position on the circumference of the 200mm or 300mm wafer. A unique high ...


JEOL Introduces Ultrahigh Resolution Field Emission SEM for Nanotechnology
Peabody, Mass., May 17, 2006 --  JEOL USA, a leading manufacturer of electron microscopes and analytical instruments, introduces a new ultra-high resolution Field Emission Scanning Electron Microscope (SEM) with advanced optics that clearly reveal intricate surface details during observation of nano structures of medical, biological, materials science, and semiconductor samples. Unique in-lens performance with semi-in lens advantages The performance and stability of the new JSM-7500F allows specimens to be easily observed at magnifications up to ...


Untethered TEM
Peabody, Mass., April 17, 2006 --  JEOL USA recently demonstrated a revolutionary remote capability for operating a transmission electron microscope (TEM) using a laptop computer with a cellular network connection. While seated at a picnic table 300 miles away, JEOL applications specialists manned the controls of a JEM-2200FS TEM operated at Lehigh University in Pennsylvania. Untethered TEM operation is a unique capability from JEOL made possible with a simple instrument control knobset and laptop computer ...


JEOL USA Sales Director, Peter Genovese, Promoted to Vice President
Peabody, Mass., April 7, 2006 – JEOL USA, a leading supplier of electron microscopes and analytical instruments with annual sales of more than $100 million, has appointed Sales Director Peter Genovese to the position of Vice President. Mr. Genovese has held successive management positions in the sales organization since joining JEOL in 1983. He manages a sales team with regional offices throughout the U.S., Canada, and Mexico as well as South America. JEOL USA, established ...


New Direct Analysis Mass Spec Applications Notebook (Volume 2)
Peabody, Mass., March 17, 2006 -- A new applications notebook from JEOL USA comprises more than 25 recent applications notes resulting from analyses using the AccuTOF™ DART™ (Direct Analysis in Real Time) mass spectrometer. The broad range of applications in this second volume of notes published since the introduction of DART includes pharmaceuticals, foods, industrial products, forensic evidence, and biological fluids analyzed without sample preparation. Samples are analyzed in open air using the DART ion source, ...


New Single-Beam FIB Offers Unique Cost Performance
Peabody, Mass., March 9, 2006 -- A new single-column focused ion beam (FIB) system from JEOL makes automated, high-speed specimen preparation affordable at nearly one-third the cost of dual beam FIBs. The JEOL JEM-9320 FIB prepares thin films and cross sections for failure and defect analysis at the nanoscale using S/TEM, TEM or surface observation. An ion beam current of 30nA at 30kV delivers fast, automated precise milling of specimens, which can be observed in ...


JEOL Demonstrates Latest Scientific Instruments at Pittcon 2006 -- March 13th-16th
Peabody, Mass., February 14, 2006 – Live demos of a new low vacuum, high resolution SEM, direct analysis in real time mass spectrometer (AccuTOF-DART™), and remote operation of ECA/ECX NMR spectroscopy systems will be ongoing in the JEOL booth, #2132 and 2133 at the Orange County Convention Center West Building, Orlando, Florida. ...


JEOL Introduces New Series of Scanning Electron Microscopes
Peabody, Mass., February 14, 2006 – JEOL USA, a leading supplier of scientific and analytical instruments, has introduced a new series of high resolution tungsten scanning electron microscopes (SEMs) featuring multiple live image displays, streamlined graphical interface, and improved low kV operation. The new SEM series enables simultaneous observation of up to three different images (secondary electron, backscattered electron, and digital camera), on-screen measurement, and smart settings for simplified functionality. Secondary electron resolution is 3.0nm ...


Changing the Course of Mass Spectrometry with Direct Analysis
Peabody, Mass., February 9, 2006 – Since capturing the Editor’s Gold Award for best new product at Pittcon 2005, the DART™ direct analysis ion source has found some unusual applications that, prior to this new technology, would have been virtually impossible. For example, fingerprints contain a great deal of chemical information that is not often exploited for forensic analysis. DART can detect and identify the chemical components of fingerprints, often providing information about specific substances ...


JEOL USA and MIT Institute for Soldier Nanotechnologies Enter Partnership Agreement
Peabody, Mass., December 7, 2005 – The USA subsidiary of JEOL Ltd., an international supplier of electron microscopes and analytical instruments, has entered into a partnership agreement with Massachusetts Institute of Technology’s Institute for Soldier Nanotechnologies (ISN). The mission of the ISN, a research collaboration between the United States Army and MIT, is to develop innovations in outfitting soldiers with equipment and apparel to dramatically improve their survivability and mobility. The use of nanotechnology will ...