JEOL USA Press Releases

JEOL Ltd. (President & CEO Izumi Oi) announces the release of “SuperCOOL MARVEL HCN,” a new liquid-nitrogen-cooled cryogenic probe for Nuclear Magnetic Resonance (NMR) spectroscopy. The probe offers triple-resonance capability (1H/19F, 13C and 15N), making it suitable for a wide range of biomolecular applications. The initial release is for 600 MHz NMR systems. Sales are scheduled to begin in August 2026. High-Sensitivity Triple-Resonance Probe for Biomolecular Analysis SuperCOOL MARVEL HCN is a newly developed liquid-nitrogen-cooled cryogenic NMR probe. ...

JEOL Ltd. (President & CEO Izumi Oi) announced the release of Double- or Triple- Resonance Auto Switched High-sensitivity COOL Probe “SuperCOOL MARVEL HFX Duo” for Nuclear Magnetic Resonance, NMR, on September 2nd, 2026. Its sales are scheduled to begin in September 2026. Expanding the Possibilities of 19F NMR with a High-Sensitivity HFX Cryoprobe SuperCOOL MARVEL HFX Duo has the features of high-sensitivity probe ”SuperCOOL MARVEL” launched in 2024 and double- or triple- resonance auto switched probe ”ROYALPROBETM HFX” launched in 2017. ...

JEOL Ltd. (President and CEO: Izumi Oi) has developed the new 300kV atomic resolution analytical microscope "GRAND ARM™ 3" and launched it on August 3, 2026. Development Background JEOL's flagship model, the 300kV atomic resolution electron microscope, has greatly enhanced its observation and analysis capabilities as the GRAND ARM™ 3. JEOL's joint development with CEOS GmbH, Germany has enabled the latest aberration correctors, Large Aperture STEM Corrector (LASCOR) and Advanced TEM Corrector (ATCOR) to be installed in ...

JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. Background of development As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult to contact and measure microscale circuits using nano-manipulators. In addition, contact caused by probing may affect the analysis target, necessitating new failure analysis methods. JEOL has conducted long-term research on the ...

RALEIGH, N.C. (October 22, 2026): A team from North Carolina State University, Oak Ridge National Laboratory (ORNL) and JEOL Ltd. has 3D printed full-size tungsten tiles for the inside wall of a fusion device, finished them to tight tolerances and tested them in the DIII-D National Fusion Facility in San Diego. The tile surfaces were directly exposed to 74 plasma discharges with significant heat and particle flux, and came through intact. The project went from ...

JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026. Development Background Benchtop scanning electron microscopes are increasingly used across a wide range of fields, including electrical and electronics, automotive and machinery, steel and metals, chemical and pharmaceuticals. They are utilized not only in research and development but also in manufacturing-related applications, such as quality control and product inspection. In addition, they ...

JEOL Ltd. (President & CEO: Izumi Oi) has developed the ACE eye™, a transmission electron microscope (TEM) for semiconductor analysis, and began sales in July 2026. By automating the entire measurement workflow —from TEM/STEM observation to EDS analysis— the ACE eye™ delivers highly reproducible measurements that are less dependent on operator expertise. It also supports long-duration, continuous automated measurement, helping to improve the efficiency of semiconductor device R&D, process evaluation, and failure analysis. Background to Development Semiconductor ...

Tokyo, Japan — 3rd August 2026— JEOL Ltd. (President & CEO: Izumi Oi) today announced the CRYO ARM™ 300S and CRYO ARM™ 200S, JEOL’s latest 300 kV and 200kV cold field-emission cryo-electron microscope that offers single-particle analysis (SPA), cryo-electron tomography (cryo-ET), 3DED/MicroED and beyond, all in one highly automated instrument. The CRYO ARM™ 300S and 200S are engineered to deliver high-resolution structural data with the stability, throughput and ease of use that today’s structural-biology and drug-discovery ...

July 16, 2026 — Peabody, Mass. — JEOL USA, Inc. has expanded its Board of Directors with the appointment of two members of its leadership team, Donna Gosselin and Steve Tryon. In addition, Dr. Thomas Isabell was appointed President of JEOL USA. Together, they bring decades of leadership experience spanning product management, applications, and field service, further strengthening the company's governance and strategic direction. Dr. Thomas Isabell has been a member of the JEOL management ...

JEOL Ltd. (President & CEO: Izumi Oi) has developed the “LazEdge”, an SEM system equipped with a laser processing system, and begins sales on May 25, 2026. Cross-section preparation instruments such as the focused ion beam system (FIB system), are widely used in science and technology fields across research institutes, universities, and industries. In recent years, demand is increasing for a system that can process large-areas at a high speed, while achieving high-quality of ...