Electron Optic Documents

In this note, we report time-resolved TEM observations on the sub-millisecond order using the Relativity™ sub-framing system based on an electrostatic beam deflector manufactured by IDES.

The 2100Plus is a multi-purpose 60-200kV TEM/STEM equipped with a LaB6. The 2100Plus enhances a laboratory's imaging capabilities. Learn more here.

TEMPO improves the amount of information obtained for a given electron dose, the information efficiency, of STEM experiments.

As seen in Ultramicroscopy, Volume 140, May 2014, Pages 37-43.

JEOL’s Three Dimensional Image Software is a program that takes stereo pair SEM images and constructs a three dimensional (3D) image of the sample surface. From this 3D image, height and contour maps can be created to provide cross sectional shape and height data. The easiest approach to creating stereo pair images is to take two images of the same area but at different tilt angles. Images can be taken with any detector, at any magnification, with high or low accelerating voltage and even in low vacuum mode. With this software, any offset to the stereo pair images can be corrected for automatically and an anaglyph image or 3D model of the surface created.

The Tilt Rotation Motor Drive Holder (TRMH) is a motorized specimen holder designed for the JCM-7000, NeoScope™. This holder provides tilt and rotation capability during image observation. Installing this holder allows for 4 axis motor control.

The Electrostatic Dose Modulator (EDM) makes stroboscopic measurements simple for TEM and STEM. In this application note, pulsed illumination boosts the time resolution of Differential Phase Contrast (DPC) imaging using the already-fast SAAF Quad segmented detector.

TEM is an ideal technique for analyzing metals to gain an understanding of their structural and elemental properties on the sub-micrometer to atomic scale.

The Electrostatic Dose Modulator (EDM) is a fast beam blanking system with a pre-sample electrostatic deflector, including electronics and software control.

Imaging of nanostructured materials requires a new design of SEM that provides ultimate resolution for both imaging and microanalysis, combined with the ability to image any type of material. An innovative new SEM column design from JEOL Ltd. utilizes a hybrid lens (combination electrostatic and electromagnetic lenses) in conjunction with a Through-The-Lens (TTL) detection system to provide the user with ultimate imaging and analytical performance. The hybrid electrostatic/electromagnetic lens minimizes magnetic field effects at the sample and is relatively impervious to stray magnetic fields. The lens is characterized by low values for the spherical and chromatic aberration coefficients. Moreover, the proven Aberration Correction Lens (ACL) technology automatically maintains small probe size for both imaging and microanalysis.