Electron Optic Documents

The first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard for determining SEM resolution. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution.

The first commercially available SEM was introduced over 50 years ago and to this day there is still no internationally accepted standard procedure for determining the resolution in an SEM image. To add to the confusion, each SEM manufacturer relies on their own sample and methods for determining resolution. Defining the edge of a particle manually is also always subjective in nature; values will differ from one person to the next based on how that person interprets or ‘sees’ the edge of a particle.

In scanning electron microscopy (SEM), conductive coatings are commonly applied to the surface of insulating or beam sensitive materials such as biologic specimens, polymers, ceramics, geologic specimen, and semiconductors to dissipate charge build-up or reduce structural damage resulting from interaction with the electron beam. There are a wide variety of commercially available coating materials, including metals such as gold, platinum and iridium and non-metals including carbon. But which, if any, is right for you? Here we discuss when it is appropriate to add a conductive coating to insulating or beam sensitive materials and how to pick the best coating material for your applications.

Since the Scanning Electron Microscope (SEM) was first commercialized about 40 years ago, the SEM has shown a remarkable progress. Now, many types of SEMs are being used, and their performance and functions are greatly different from each other. To utilize these different SEMs, it is essential to recognize their features, as well as to understand the reasons for the contrast of SEM images. Thus, this document material is aimed at helping SEM users and future SEM users to understand the basics of the SEM, including the instrument principles, specimen preparation and elemental analysis.

SEM images are often displayed as a 2D view or projection of a 3D specimen, which could be often frustrating for researchers who are interested in uncovering the topography features that are in the ‘hidden’ 3rd dimension.

SEM is an indispensable tool for studying the microstructure of a wide variety of materials. The images generated are inherently a 2 dimensional representation of the sample surface. Unlocking the 3rd dimension by reconstructing a 3D model from multiple SEM images can enhance our understanding of complex microstructure. This 3D view is often more intuitive and surface metrology characteristics can be calculated.

In this interview, AZoM speaks to Vern Robertson, EPMA Product Manager at JEOL USA, about the benefits of using a low kV in SEM imaging.

JEOL is always making efforts to meet the needs of our customers in all areas including hardware and software of our instruments. Our efforts to grasp customer requirements include question and answer opportunities during technical seminars and meetings. Based on these questions, we have published this Q&A book.

Tomographic and microED data sets created by SerialEM are single files with the data stored typically as 16-bit signed or unsigned integers. When these files have to be copied from the computer onto a USB drive, problems can arise.

What makes the difference between a good SEM image and a stellar one? Imaging samples at the appropriate conditions, and that often means at very low accelerating voltage (low kV). It's time to give it a try! Every modern day scanning electron microscope (SEM) from the top of the line, ultra-high resolution field emission SEMs to the most economical entry level bench-top tungsten (W) thermionic SEMs have the capability of imaging samples at very low accelerating voltage (Low kV ). Low kV imaging has many benefits and this easily accessible function should not be overlooked.