Electron Optic Documents

The F2 is a new concept of 20-200kV TEM. This new generation of multi-purpose electron microscope is designed specifically to meet today's diversified needs. Thanks to the high brightness and small probe size, the F2 is able to reach an unprecedented guaranteed resolution for STEM (0.14nm), EDS (1.7sr) and EELS (0.3eV) at the same time, creating a new class of high-end non-corrected TEM.

The F2 incorporates a new, intuitive user interface specifically designed for analytical electron microscopy. This new interface integrates many improvements for the TEM control, such as; automatic functions (auto brightness/contrast, auto focus, auto Z, auto stigmator), coma free auto alignment and off-line data processing (Analysis Center). The software can be tuned at your convenience to provide you with the best working environment.

Contamination and Off-Flavor; Evaluation and Analysis

One of the main imaging artifacts generated during specimen observation in SEM is specimen charging. The effect of charging manifests itself either via ‘flattening’ of the image due to the beam deflection close to the source of charging, or extremely high or low contrast and image distortion. This artifact can be substantially reduced by either application of conductive coating to the sample or by lowering the primary beam voltage. Contemporary FE-SEMs have the ability to produce nm size spot sizes even at 1kV and below, paving the way for high resolution imaging and analysis of nanomaterials and surfaces without the need for conductive coating.

Resolution can be improved for all accelerating voltages.

Using a multi-hole imaging scheme, researchers have been able to reach a hitherto unprecedented milestone of 20,000 images/day on both a CRYO ARM™ 300 II and a JEM-F200. Given that many structures on EMPIAR have required around 5000 images, essentially 4-5 projects can be accomplished on a daily basis, which opens up new opportunities for routine high resolution structure determination at unprecedented levels.

High resolution structure determination by electron cryo-microscopy (cryoEM) and Single Particle Analysis (SPA) has progressed to the point where structures can routinely be determined to be better than 2Å resolution using either a 200 or a 300 kV microscope. At 1.8Å resolution, details like amino acid isoforms can be distinguished. This application note highlights improved results that were obtained on apoferritin at 1.34Å resolution that hint at new features.

The quest for renewable energy sources is prompting the development of technologies capable of tapping into alternative energy sources such as solar, wind, geothermal and tidal energy. To fully exploit these energy sources, engineers need novel ways of storing and converting these energies.

Graphene is a crystalline form of carbon defined as a hexagonal arrangement of carbon atoms in a one-atom thick planar sheet. Graphene has outstanding properties (mainly mechanical strength, optical transparency and excellent electrical and heat conductivity) that make it an attractive material for electronics applications. Traditionally, graphene structures have been imaged with aberration-corrected TEM, AFM, or STM.

The combination of Scanning electron microscope (SEM) imaging and embedded microanalysis (EDS) offers the perfect combination of direct particle visualization and chemical information at the same time. The recent emergence of automated solutions and multi area analyses has brought this technique to the forefront of the available automated particle analysis solutions.