Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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Will provide capabilities to establish world class facility at UTEP

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Appointments of new sales manager and customer service representative

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New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope

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JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.

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Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.

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SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

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Analytical field emission SEM is part of the University’s vigorous WVNano Initiative

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Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples

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Member of the JEOL sales organization for more than 25 years

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JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory

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New benchmark for advanced, aberration-corrected S/TEM technology with the highest resolution commercially available in its class

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Internationally known for its state-of-the-art laboratories and work in small-particle identification and analysis, the College of Microscopy provides highly specialized training and continuing education for scientists, crime lab personnel, researchers, educators and technicians from around the world.

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Highest sensitivity of any GC time-of-flight mass spectrometer commercially available

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60th anniversary kicks off with celebration at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition on laboratory sciences

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Includes helpful links to applications notes using Direct Analysis in Real Time (DART) open air mass spectrometry, and links to profiles of real case studies involving the use of JEOL Scanning Electron Microscopes (SEM).

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