Emory University Orders Two JEOL Cryo-TEMs for Expanding the Electron Microscopy Core

host posted on September 01, 2010 22:44

August 31, 2010 (Peabody, Mass.) -- JEOL USA, a leading supplier of high resolution Transmission Electron Microscopes (TEMs) for biological and materi...

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26

JEOL Scanning Electron Microscope Offers Versatile Through-the-Lens System for Ultrahigh Resolution

host posted on August 26, 2010 00:29

Combines new objective lens and detector technologies with the proven JEOL in-lens Field Emission Gun

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18

JEOL Correlative Microscope Wins MT-10 Award

host posted on August 18, 2010 23:28

Top honors for the JEOL ClairScope

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18

JEOL AccuTOF-DART Mass Spectrometer Used in Georgia Institute of Technology’s Newly-Developed Ovarian Cancer Test

host posted on August 18, 2010 23:26

New Paper Published in Epidemiology, Biomarkers, & Prevention Research

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20

New Cold Field Emission Gun Enhances Ultrahigh Atomic Level Resolution of JEOL ARM200F Aberration-Corrected S/TEM

host posted on July 20, 2010 22:41

Imaging resolution guaranteed at 78 picometers with an energy resolution of 0.3 eV

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13

New JEOL Correlative Microscope Makes U.S. Debut at M&M and Northwestern University after Winning R&D 100 Award

host posted on July 13, 2010 18:43

This August, JEOL USA will demonstrate the first correlative microscope to enable concurrent light microscopy and atmospheric scanning electron microscopy (ASEM) for observation of and experimentation on samples in their native state.

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25

Scanning Electron Microscope Reveals “The Scream” in Oil Shale

host posted on May 25, 2010 09:52

Who says science isn’t fun?

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21

JEOL Reinvents Time-of-Flight Mass Spectrometry with Innovative SpiralTOF™ MALDI-TOF System

host posted on May 21, 2010 15:04

Reinvents Time-of-Flight ion optics with an extended flight length in a compact footprint

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06

JEOL Offers First Commercially-Available Thin Film Phase Plate Technology for TEM

host posted on April 06, 2010 14:12

Multifold Increase in Biological Specimen Imaging Contrast

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29

Award-winning Pioneer in Nanoscience Research Visits JEOL USA

host posted on March 29, 2010 12:07

Nanoscience owes much to the discoveries of world renowned physicist Dr. Sumio Iijima

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18

UT Dallas Re-energizes Semiconductor Nano Research with Acquisition of New JEOL Atomic Resolution Microscope

host posted on March 18, 2010 11:37

UT Dallas advances its role as key contributor to the development of next-generation semiconductor devices

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18

First JEOL JEM-ARM200F Electron Microscope Produces Atomic Resolution Data in Record Time at University of San Antonio

host posted on February 18, 2010 20:51

Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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08

New JEOL Microprobe Helps Advance Research Opportunities for Students and Industry in North Carolina

host posted on February 08, 2010 09:31

Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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21

New DART SVP Source and iDART Automation Streamline JEOL AccuTOF-DART™ Time-of-Flight Mass Spectrometer Performance

host posted on January 21, 2010 21:33

Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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16

JEOL Cryo-TEM to Enable New Structural Biology Research at University of Texas El Paso

host posted on December 16, 2009 08:58

Will provide capabilities to establish world class facility at UTEP

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03

JEOL Canada Increases Sales Support for Scientific Instrumentation

host posted on December 03, 2009 10:22

Appointments of new sales manager and customer service representative

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22

JEOL Introduces a New Correlative Microscopy Tool for Observing Biological Samples and Materials in Atmosphere

host posted on October 22, 2009 22:51

New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope

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10

JEOL TEM Specialist to Serve as Visiting Scientist at Lehigh University

host posted on September 10, 2009 10:45

JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.

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01

JEOL to Remotely Demonstrate New High Throughput, Ultrahigh Resolution Analytical FE SEM at Semicon West 2009

host posted on July 01, 2009 11:28

SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

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