In this work, we conducted a comprehensive analysis of impurities contained in two different commercial IPA products, using a JMS-T2000GC, one of JEOL’s gas chromatography-high resolution mass spectrometers (GC-HRMS). We also used two different GC columns to identify impurity components to examine polarities and diverse molecular structures of the compounds. Our objective is to prove the effectiveness of the JMS-T2000GC combined with its qualitative analysis software, msFineAnalysis AI, in qualitative analysis of trace organic impurities contained in different IPA samples, so that we can contribute to enhancing the performance level of solvent quality control in semiconductor fabrication.