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   NEWS & EVENTS : Press Releases  
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JEOL USA Press Releases
Current News  Archived News  
JEOL to Demonstrate Remote Microscopy at M&M 2008
Thursday, July 31, 2008 (215 reads)
Sirius remote TEM operation
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JEOL Introduces New Thermal FE-SEM at M&M 2008
Thursday, July 31, 2008 (183 reads)
Will demonstrate a new high throughput Thermal Field Emission (FEG) Scanning Electron Microscope (SEM), the JSM-7600F.
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JEOL Debuts New Products at M&M 2008
Thursday, July 31, 2008 (150 reads)
See the new JEOL lineup: Power Tools for Microscopy and Sample Processing
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JEOL Adds New FE MultiBeam to Its SEM/FIB Lineup
Thursday, July 31, 2008 (194 reads)
Ongoing Demonstrations in JEOL’s Ion Beam Power Tools Booth at M&M 2008
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JEOL to Hold Tutorial Session for Practical Remote In Situ Microscopy (PRISM) at M&M 2008
Thursday, July 31, 2008 (68 reads)
New Protochips heating holder to be remotely demonstrated on Oak Ridge National Labs Aberration-corrected JEOL TEM
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JEOL Introduces Multiple Software Enhancements to Advance TEM Imaging and Data Acquisition
Thursday, July 31, 2008 (55 reads)
Live demonstrations and tutorials to be held at M&M 2008
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8 Awards in 8 Years
Thursday, June 26, 2008 (167 reads)
JEOL Wins 8th Omega Award for Service
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JEOL Publishes 4th Edition of Applications Notebook for AccuTOF™-DART™ Open Air Mass Spectrometry
Thursday, May 15, 2008 (371 reads)
4th edition of the AccuTOF-DART applications notebook and the individual applications notes can be downloaded from the JEOL USA website
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Nikon and JEOL Join Forces to Introduce NeoScope Benchtop SEM
Monday, March 03, 2008 (1725 reads)
Two of the world’s leading imaging equipment suppliers - Nikon Instruments and JEOL - have joined forces to bring a new benchtop SEM to the market.
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DART™ Analysis of Aspirin: Correcting a Misapprehension
Thursday, January 31, 2008 (731 reads)
In a recently published comparison of the ambient ionization techniques direct analysis in real time (DART™) and DESI, it was reported that a protonated molecule was not observed for DART, whereas the protonated molecule could be observed for DESI and DAPCI. This is an incorrect observation, resulting from the use of different experimental conditions for DART than were used for the other two techniques.
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Boston College Integrates Nanofabrication with New JEOL Instruments
Tuesday, January 15, 2008 (620 reads)
Boston College has selected the new JEOL MultiBeam Focused Ion Beam system and a Field Emission Scanning Electron Microscope for its nanofabrication clean room facility in Newton, Massachusetts.
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New “CarryScope” Mobile SEM from JEOL
Wednesday, January 09, 2008 (527 reads)
New mobile Scanning Electron Microscope that can travel or easily be moved to different locations as needed.
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New JEOL MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging
Tuesday, November 27, 2007 (777 reads)
High-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair.
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USC Selects JEOL for New Center of Excellence
Monday, November 05, 2007 (629 reads)
Purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's new Center of Excellence for Nano-Imaging in Los Angeles, California.
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Cross Atlantic Operation of JEOL 2200FS Aberration Corrected Electron Microscope
Tuesday, October 16, 2007 (240 reads)
One of the world's leading electron microscopes at Oak Ridge National Laboratory, the JEOL 2200FS Aberration Corrected Electron Microscope (ACEM), is controlled and manipulated from London via the Lambda Rail.
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JEOL Puts Viruses Under the Microscope
Sunday, October 14, 2007 (134 reads)
The recent acquisition of Jeol's latest 300 kV field emission Transmission Electron Microscope (TEM), the JEM-3200FS, by Indiana University in the US for studying viruses is symptomatic of the ever increasing need for structural information about viruses to aid in the drug discovery process.
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MIT and Boston Japanese Consulate Host President of Tohoku University
Saturday, October 13, 2007 (418 reads)
Global Nanorace for New Materials Spurs Research and Industry
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New Mass Spectrometry Newsletter from JEOL USA
Wednesday, October 03, 2007 (337 reads)
Get the latest in mass spectrometry applications and news from JEOL USA through its new online newsletter, Mass Media.
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