JEOL USA Press Releases


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New JEOL MultiBeam SEM/FIB for Simultaneous Micro Milling and High Resolution SEM Imaging
Tuesday, November 27, 2007 (874 reads)
High-productivity tool for IC defect analysis, circuit modification, TEM thin film sample preparation, and mask repair.
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USC Selects JEOL for New Center of Excellence
Monday, November 05, 2007 (760 reads)
Purchased six electron microscopes, including a newly introduced SEM-FIB (a dual column focused ion beam system) for the university's new Center of Excellence for Nano-Imaging in Los Angeles, California.
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