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Saturday, March 13, 2010
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  NEWS & EVENTS : Press Releases  
News & Events
  
JEOL USA Press Releases
18

Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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08

Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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21

Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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16

Will provide capabilities to establish world class facility at UTEP

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03

Appointments of new sales manager and customer service representative

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22

New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope

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10

JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.

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11

Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.

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01

SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

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26

Analytical field emission SEM is part of the University’s vigorous WVNano Initiative

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11

Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples

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04

Member of the JEOL sales organization for more than 25 years

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28

JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory

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