Demonstrates the stability of this all-new instrument and the skill of the UTSA-JEOL team to quickly power up the first TEM of its kind.

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Will expand research and educational opportunities for students, faculty, and industry in southeastern North Carolina.

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Offers a new set of performance features for accurate mass measurements in real time using advanced time-of-flight technology.

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Will provide capabilities to establish world class facility at UTEP

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Appointments of new sales manager and customer service representative

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New ClairScope™ Combines Atmospheric Scanning Electron Microscope (ASEM) with Light Microscope

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JEOL Applications Specialist Dr. Toshi Aoki helping customers optimize the powerful imaging and analysis capabilities of their JEOL field emission TEMs.

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Two new publications explain theory and operation of the SEM for routine imaging and elemental analysis.

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SEM will be remotely operated from JEOL’s booth #606 to demonstrate ultrahigh imaging resolution at up to 1,000,000X magnification, and X-ray analytical mapping of individual layers, elemental composition, contaminants, particulates, and process defects in semiconductor devices.

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Analytical field emission SEM is part of the University’s vigorous WVNano Initiative

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Illustrates the application of an ion beam cross section polisher for SEM sample preparation of solar panel thin films and kerogen-rich shale samples

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Member of the JEOL sales organization for more than 25 years

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JEOL ARM200F to Be Delivered to FSU’s National High Magnetic Field Laboratory

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