JEOL in the News

rss

eBeam Initiative Roadmap to Focus on Semiconductor Photomask Critical Dimension Uniformity at SPIE Advanced Lithography 2012 Symposium

eBeam Initiative Roadmap to Focus on Semiconductor Photomask Critical Dimension Uniformity at SPIE Advanced Lithography 2012 Symposium

Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures

Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures

New record for world's smallest atomic valentine

New record for world's smallest atomic valentine

Mentor Graphics and JEOL to Develop Advanced IC Mask Writing Solutions

 Multi-resolution writing for shot count reduction of up to 30% compared to the conventional writing technique

Uncovering high-strain rate protection mechanism in nacre

Involves the emission of partial dislocations and the onset of deformation twinning

UK NMR facility orders Europe's first 1 mm magic-angle spinning probe

Awarded to JEOL (UK) Limited

JEOL Chemist Receives Prestigious Anachem Award

For contributions to the development of organic mass spectrometry

Oswego State invests in research

Nano microscope for use in multiple department

Microscopy For Undergrad Chemists

New program offers advanced training and first four-year degree in chemical microscopy

DART scores direct hit: Applying ambient mass spectrometry to forensic drug analysis

US forensic scientists have shown that combining thin layer chromatography (TLC) with a novel form of ambient mass spectrometry known as direct analysis in real time (DART) provides a particularly efficient and effective way to analyze unknown drug samples.