Researchers in Japan are the first to have succeeded in detecting single atoms using X-ray spectroscopy.
Researchers in the UK and Japan have succeeded in tracking dislocations in graphene – a sheet of carbon atoms just one atom thick – with unprecedented resolution using electron microscopy.
Offers higher magnification than the original NeoScope bench-top version, introduced in 2008.
"We can look at one atom and probe or ‘tickle’ it to see how it bonds to a neighboring atom. This is unprecedented,” said Robert Klie, associate professor in the Department of Physics.
Rapidly evaluate the tougher advanced materials needed to build the next generation of nuclear reactors and extend the lives of current reactors
Advances in Correlative Microscopy Integrating Optical, X-Ray/CT, and SEM Technologies
Small Instruments, Big Results - NeoScope for Pharmaceutical Applications
UTEP acquires new $1.8M cryo-electron microscope for biochemistry research
eBeam Initiative Roadmap to Focus on Semiconductor Photomask Critical Dimension Uniformity at SPIE Advanced Lithography 2012 Symposium
Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures