JEOL in the News

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JEOL's Centurio SDD EDS with large solid angle used to detect single atoms within a nanostructure

Researchers in Japan are the first to have succeeded in detecting single atoms using X-ray spectroscopy.

TEM tracks dislocations in graphene

Researchers in the UK and Japan have succeeded in tracking dislocations in graphene – a sheet of carbon atoms just one atom thick – with unprecedented resolution using electron microscopy.

JEOL Debuts New NeoScope SEM at Semicon West

Offers higher magnification than the original NeoScope bench-top version, introduced in 2008.

Tickling Atoms and Testing Theories

"We can look at one atom and probe or ‘tickle’ it to see how it bonds to a neighboring atom. This is unprecedented,” said Robert Klie, associate professor in the Department of Physics.  

Sandia's Ion Beam Laboratory looks at advanced materials for reactors

Rapidly evaluate the tougher advanced materials needed to build the next generation of nuclear reactors and extend the lives of current reactors

Advances in Correlative Microscopy Integrating Optical, X-Ray/CT, and SEM Technologies

Advances in Correlative Microscopy Integrating Optical, X-Ray/CT, and SEM Technologies

Small Instruments, Big Results - NeoScope for Pharmaceutical Applications

Small Instruments, Big Results - NeoScope for Pharmaceutical Applications

UTEP acquires new $1.8M cryo-electron microscope for biochemistry research

UTEP acquires new $1.8M cryo-electron microscope for biochemistry research

eBeam Initiative Roadmap to Focus on Semiconductor Photomask Critical Dimension Uniformity at SPIE Advanced Lithography 2012 Symposium

eBeam Initiative Roadmap to Focus on Semiconductor Photomask Critical Dimension Uniformity at SPIE Advanced Lithography 2012 Symposium

Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures

Advanced Microanalysis Methods Solve Automotive Paint Adhesion Failures