JEOL in the News


A New Material that Could Revolutionize Electronics

As seen in Lab Manager

Environmental Contaminants as Needles in a Haystack

As seen in Atlas of Science.

Extreme Microscopy: Prof Peter Nellist focuses on advanced STEM-based methods to image and analyse myriad materials at atomic resolution.

As seen from

AccuTOF-DART: Versatile and powerful tool for forensic drug screening

Video interview with Robert Steiner, M.S., Principal Forensic Scientist and Instrument Specialist, Virginia Department of Forensic Science

What’s on Your Dollar Bill?

DART co-inventor discusses the crazy things found on paper money since company first started looking at currency.

Former Roanoke resident's invention streamlines drug analysis for state lab

As seen at the Roanoke Times

Roanoke native's invention helping solve criminal cases faster

As seen on


In a recent collaboration, Ontario’s Ministry of the Environment and Climate Change recently collaborated with JEOL USA to identify pollutants found in electronics waste recycling using new analytical methods.

The first ever photograph of light as both a particle and wave

Scientists at EPFL have succeeded in capturing the first-ever snapshot of this dual behavior

Nikon Instruments and JEOL form strategic partnership tying together light and electron microscopy

Alliance will research and develop tools that combine the advantages that each technology provides
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