JEOL USA Press Releases

January 20, 2025, Peabody, MA.  JEOL USA announces the release of its new broad ion beam milling instruments, Cross Section Polisher™ (CP) and Cooling Cross Section Polisher™ (CCP).  These instruments are widely used for preparing high quality, artifact-free cross sections for imaging and microanalysis by SEM, EPMA or Auger. These new configurations have an improved High Speed Milling Source for ultra-fast milling rates, up to 1.2mm/h.  A new flow-chart style control panel guides the user ...

JEOL USA is proud to share the publication of research by The University of Tokyo in Nature Reviews Electrical Engineering, showcasing the advanced capabilities of the JEOL MARS (Magnetic field-free Atomic Resolution imaging System).  This research highlights how advanced DPC STEM is revolutionizing the nanoscale imaging of electromagnetic fields in state-of-the-art electronic and spintronic devices, paving the way for innovative breakthroughs in materials science, "We emphasize the immense potential of advanced DPC STEM for the ...

JEOL is proud to announce the JEM-Z200MF, a state-of-the-art scanning/transmission electron microscope (S/TEM) designed for atomic resolution imaging in a magnetic field-free environment. The MARS (Magnetic field-free Atomic Resolution imaging System) enables high resolution observation without applying strong magnetic field to specimen. This observation method is expected to become a groundbreaking tool that will significantly advance cutting-edge material research and development in fields such as magnets, steel, semiconductor devices, and quantum technology. Recently highlighted in a ...

The introduction of direct electron detectors significantly improved the signal-to-noise ratio of electron micrographs, resulting in a marked enhancement in the quality of cryo-electron microscope (EM) reconstructions (now referred to as the “resolution revolution”). This approach, along with advances in image processing and data collection, has pushed the resolution of single-particle cryo-EM reconstructions into the range where the electron source could become a limiting factor. This in turn has led to the reconsideration in cryo-EM ...

The JSM-IT810 series Ultrahigh Resolution FE SEM made its debut at the Microscopy and Microanalysis 2024 conference in late July. This debut included live demonstrations for those in the market for an analytical ultrahigh resolution FE SEM. This new platform is where versatility meets high spatial resolution and ease-of-use with the next level in JEOL’s intelligent technology for imaging and analysis at the nanoscale. Powerful software with automation built-in, enables seamless acquisition of data from ...

JEOL (President & CEO Izumi Oi) announced the release of the "ROYAL PROBE™ AUTOMAS", a high-throughput solid-state NMR probe for nuclear magnetic resonance (NMR) systems, on 1st July 2024. The ROYAL PROBE™ AUTOMAS is the successor to the AUTOMAS probe, which was launched in 2018 as a high-throughput solid-state NMR probe. The AUTOMAS probe, in combination with the NMR software Delta, the Auto Sample Changer (ASC), and the Auto-Tuning Unit, allows multiple samples to be measured ...

JEOL Ltd. (President & CEO Izumi Oi) announced the release of High Sensitivity COOL Probe "SuperCOOL MARVEL" for Nuclear Magnetic Resonance, NMR, on July 1st, 2024. Its sales are scheduled to begin in October 2024. SuperCOOL MARVEL is the fourth generation of the SuperCOOL probe series, which was launched in 2013. The SuperCOOL probe series suppresses thermal noise and enables highly sensitive NMR measurements by cooling the RF coil and preamplifier to liquid nitrogen temperature. ...

JEOL (President and CEO: Izumi Oi) announces the release of the new electron microscope JEM-120i developed with the concepts of "Compact", "Easy To Use", and "Expandable" on May 30, 2024. Electron microscopes are utilized in a wide range of fields from biotechnology to nano technology, polymers, and advanced materials. With the expansion of application, usages are also expanding, which requires a tool that is easy-to-use for research and testing purposes. To satisfy such needs, the ...

JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron Microscopy. The new system complements JEOL’s existing Cryo-TEM technology and provides a comprehensive solution for preparing and imaging vitreous frozen biological and biopolymer samples to be observed in the CRYO ARM 200 and CRYO ARM 300II Transmission Electron Microscopes.  JEOL’s CRYO-FIB-SEM incorporates a liquid nitrogen cooling stage ...

Peabody, MA | Nov. 2, 2023 – JEOL’s JAM-5200EBM Metal 3D Printer, a production ready Electron Beam Powder Bed Fusion (EB-PBF) additive manufacturing solution, has demonstrated the ability to meet the rigorous AMS7032 operational qualification (OQ) standards, while achieving the AMS7011 material requirements for Ti-6Al-4V alloy with post-deposition hot isostatic pressing (HIP). JEOL’s is the first EB-PBF machine known to meet the requirements of AMS7011 since they were first established on another EB-PBF manufacturer’s ...