JEOL USA Press Releases


National Fish and Wildlife Forensic Mobile Lab Announcement

The JEOL AccuTOF™-DART® 4G mass spectrometer has been chosen as one of the key technologies in a new mobile laboratory developed by the US Fish and Wildlife Service.  The new lab was officially christened on November 3, 2022 at the Clark R. Bavin National Fish and Wildlife Forensics Laboratory in Ashland Oregon.1

The new laboratory, nicknamed “The Woodshed”, was constructed to carry out timber analyses at ports of entry. It will be used to identify illegally traded timber from endangered species and facilitate the legal timber trade. The laboratory, designed by the staff of the National Fish and Wildlife Forensic Lab, features the AccuTOF-DART mass spectrometer, a visual comparator, X-ray fluorescence (XRF) and laser-induced breakdown spectroscopy (LIBS) systems for elemental analysis, and 240V generator for off-grid analysis.

Ambient ionization, a key technology of the JEOL AccuTOF™-DART® 4G mass spectrometer, provides a unique benefit to this lab. The instrument pushes ionized gas particles through an open chamber to identify the molecular structure of any object that passes through the ionized stream. For scientists using this instrument in “The Woodshed”, this means they save time by skipping the sample preparation process, allowing them to process and identify greater quantities of illegally traded timber.

The AccuTOF™-DART® 4G DART was invented in 2003 by Dr. Robert “Chip” Cody of JEOL USA. JEOL is a world leader in manufacturing equipment and instrumentation for demanding scientific and industrial research and development. Core product groups include analytical instruments including mass spectrometers, NMRs, and ESRs and electron microscopes (SEMs and TEMs).


Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

New Gather-X Windowless EDS from JEOL Answers the Need for Higher Sensitivity and Low-energy X-Ray Detection in SEM

August 1, 2022 (M&M 2022 Portland, Oregon)

JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the entire EDS range produced from the IT800 series Field Emission SEMs including low-energy X-rays down to Lithium.

It is fully embedded in JEOL’s latest SEM Center software with Live Analysis and can be run in combination with a standard JEOL EDS. The new windowless EDS will be demonstrated on the company’s flagship SEM, The IT800, at M&M 2022.

Gather-X, a windowless EDS for the JEOL IT800 series FE SEM features:

Improved detection sensitivity for characteristic X-rays less than 1 keV and the ability to detect soft X-ray regions less than 100eV (Li-K). The unique electron trap design enables collection of the entire EDS range at beam voltages up to 30kV.

A racetrack-shaped detector that allows insertion at very short working distances while maintaining a large solid angle for efficient collection of high spatial resolution EDS maps. Higher count rates allow for fast collection times, minimizing potential beam damage with sensitive specimens.

Full integration into the new SEM operating system, allowing for safe operation at short working distances for high spatial resolution, low-energy conditions typical for Ultrahigh resolution SEMs.

The JEOL IT800 series SEM with the addition of Gather-X is designed for unprecedented ease-of-use, high-sensitivity, and spatial resolution. Gather-X operation is embedded within the SEM Center software for Live (Real-Time) display of EDS spectrum or maps with SEM imaging. High sensitivity, low energy X-ray observation is done in Real-Time. This smart-flexible-powerful Scanning Electron Microscope system delivers the highest level of intelligent technology for the most versatile high-resolution, analytical FE SEM available today.

Metal Additive Manufacturing System 3D Printer.jpg

JEOL Leverages 50 Years of E-Beam Expertise to Bring New Metal Additive Manufacturing System to the Americas

(May 2, 2022, Peabody, Mass.)

JEOL USA enters a new era of innovation with the introduction of metal additive manufacturing technology into North America backed by an extensive service and support network. JEOL, Ltd. (Tokyo, Japan) has entered the equipment production phase for the JEOL JAM-5200EBM, a new Electron Beam Melting (EBM) powder bed fusion machine that significantly improves productivity, quality, and reliability to produce stronger and lighter parts for a variety of applications.

JEOL EBM technology enables customers to:

  • Maximize Operational Equipment Efficiency
  • Reduce downtime with a long-life cathode of over 1,500 hours
  • Eliminate smoke events and trapped gasses with a clean, helium-free environment and “e-shield”.
  • Deliver rapid resolutions with JEOL USA’s extensive service and after sales support network of over 180 field service engineers
  • Enable 24/7 production via remote monitoring of conditions and manufacturing status
  • Optimize Material Performance and Minimize Defects
    • Minimize powder scattering and smoke related defects with unique pre-heat scan strategy
    • Achieve high productivity, reproducibility, and accuracy with automatic correction of focus and spot shape of the electron beam based on our market leading electron beam lithography systems.
    • Process high temperature alloys with 1100°C build temperature capability
    • Control microstructure and stresses with between layer-to-layer thermal management
  • Achieve maximum manufacturing capacity of 250mm (diameter) x 400mm (height) with initial launch materials of Ti6Al4V, Ni718, and pure copper

What makes the JEOL JAM-5200EBM unique in this growing field is JEOL’s decades-long expertise in the development and production of advanced electron optics technology used for research and industrial applications. JEOL is the market leader in electron optics systems and is already involved in the 3D printing value stream from materials characterization and particle analysis to imaging and chemical analysis. Additionally, the JAM-5200EBM’s electron beam technology draws upon JEOL’s 50-year experience in development and production of generations of mask writing and spot beam lithography tools with unique vacuum technology.

The company expects their new technology will be especially critical in serial production of high quality, reproducible metal parts used in the aerospace, automotive, and energy sectors. EBM technology makes it possible to reduce fuel consumption and increase output, reduce the cost, improve efficiency, and shorten development time, integration of multiple parts, and weight reduction. JEOL USA is expanding partnerships to integrate this 3D printing technology into mainstream production. JEOL will be introducing this new technology at the upcoming RAPID TCT event. You will find the team at Booth #1313. 

“Our long history of development and production of advanced, field-proven electron microscopy and electron beam technology, combined with JEOL’s extensive service and support network, is an opportunity to integrate quality, reliability, and productivity into the employment of this innovative technology,” said JEOL USA President, Robert Pohorenec.  

JEOL USA will introduce the new E-Beam Metal AM 3D Printer at Rapid TCT in Detroit, Michigan May 17-19, 2022, in booth #1313.

More information:


Drug Discovery Platform Solutions Using JEOL’s 800 MHz NMR!

NJ Biopharmaceuticals LLC and JEOL Ltd. Are Excited to Announce Their Collaboration to Bring Innovative Drug Discovery Platform Solutions Using JEOL’s 800 MHz NMR!

We're excited to share the news that NJ Bio is procuring an 800 MHz NMR spectrometer with a cryogenic probe from JEOL. As part of this collaboration, NJ Bio will contribute its expertise in antibody drug conjugates, oligonucleotide conjugates, and other chemistries to develop platform solutions for its drug discovery clients - in particular, a platform for using NMR-derived structural information to optimize Targeted Protein Degraders (TPDs). JEOL has world-class capability in NMR and will provide technical expertise to maximize the performance of the 800 MHz NMR in these drug discovery applications.

Learn more about this Press Release from NJ Bio

JEOL Introduces the Next Generation of JEOL NMR Spectrometers: The ECZ Luminous Series

Peabody, MA – JEOL USA is proud to announce the next generation of JEOL NMR spectrometers: the ECZ Luminous series. This product is a next step in spectrometer miniaturization and improving performance through state-of-the-art digital and high-frequency technologies. JEOL USA is a subsidiary of JEOL ltd, a well-respected manufacturer of  cutting-edge scientific equipment with more than 65 years of experience in producing advanced NMR systems.
New ECZL series features MFDS (Multi Frequency Drive System) that allows spectroscopists to perform multiple pulse trains on different nuclei on a single RF channel in same experiment. The STS (Smart Transceiver System), inherited from the previous model, achieves a time resolution of 5 ns for frequency, phase, and amplitude modulation, enabling ultra-fast control. 

The ECZL G series (400 MHz to 1.3 GHz) is the flagship model and supports expansion to more than 3 channels, with various options for high power amplifiers, and high magnetic field gradients.

The ECZL R series (400 to 600 MHz) is a fixed-configuration high-performance instrument capable of solid-state NMR measurements with less than half the footprint and only one-third the volume of previous models.

The ECZL S series (400 MHz) has the same architecture and performance as G and R models, with a configuration that is streamlined for routine solution NMR measurements.

All of JEOL’s ECZL spectrometers can be remotely accessed by multiple operators simultaneously. Combined with an automatic sample changer, the ECZ Luminous system can be used remotely in continuous automation for both solution and solid-state NMR measurements. 

JEOL is a world leader in manufacturing equipment and instrumentation for demanding scientific and industrial research and development. Core product groups include electron microscopes (SEMs and TEMs), instruments for the semiconductor industry (electron beam lithography and a series of defect review and inspection tools), and analytical instruments including mass spectrometers, NMRs, and ESRs.

JEOL USA, Inc., a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated in the United States in 1962.  The company has 13 regional service centers that offer unlimited emergency service and support in the U.S.  

For more information visit the product web page.


JEOL Introduces New Scanning Electron Microscope with “Simple SEM” Automation and Live Elemental and 3D Analysis

A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control.

JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the JSM-IT510. This new Scanning Electron Microscope features productivity enhancing automation, including “Simple SEM” automated imaging, automated montaging (both image and EDS map) and live EDS analysis (spectrum and map).

The IT510 is the successor to the popular JEOL IT500 InTouchScope SEM, with its large sample chamber and tungsten or LaB6 filament. The IT510 features JEOL Intelligent Technology that enables seamless navigation from optical to SEM imaging, Live EDS and 3D analysis, and auto functions from alignment to focus for fast, clear, and sharp images.

The user of the new IT510 has several productivity-enhancing new features:

The new Simple SEM function automates image collection at multiple locations on a sample, and sets the various conditions required, including magnification and settings. Simple SEM simplifies and automates workflow for routine tasks.

A new “Live 3D” function constructs 3D images of the sample surface during observation showing surface shape and depth information in real time.

A Signal Depth automated function calculates the X-ray generation depth to support understanding of the analytical spatial resolution within a specimen under the conditions set. Useful when conducting elemental analysis.

A new Low-vacuum Hybrid Secondary Electron Detector collects both electron and photon signals, providing an image with high S/N and enhanced topographic information. This detector also supports photon imaging with specimens that give a cathodoluminescence response.

Live Mapping displays the elemental map simultaneously with SEM imaging, made possible by a new Integrated SEM and Energy Dispersive X-ray Spectrometer (EDS) System. The user can switch seamlessly between the live map view and spectrum view during SEM image observation. Then they can overlay the element maps of interest on the live SEM image for enhancing understanding of element distribution within a specimen.

Zeromag software seamlessly navigates to the area of interest from an optical image of a larger general area of the sample. The user is never lost and can easily navigate to the desired observation area by simply clicking on the optical image.

The JEOL IT510 is designed for unprecedented ease-of-use with advanced SEM technology in a compact platform. This smart-flexible-powerful Scanning Electron Microscope delivers the highest level of intelligent technology with built-in automation for the most versatile analytical SEM available today.

For more information visit the product web page.


Covalent Metrology and JEOL Announce Partnership, Silicon Valley Demonstration Facility

The two leaders announced a partnership that includes a new JEOL demonstration facility located in Covalent’s Silicon Valley lab. The partnership will accelerate applications development and broaden client access to a suite of state-of-art instrumentation and analytical services.

December 07, 2021 – Sunnyvale, CA. Covalent Metrology, a leading North American provider of analytical services, announces its partnership with JEOL a global leader in the development of cutting-edge scientific instruments used in microscopy, analytical chemistry, and materials characterization. JEOL’s state-of-art metrology instruments spanning these disciplines are coming soon to the announced JEOL USA demonstration facility, located within Covalent’s Silicon Valley lab.

Covalent works with scientists and engineers from more than thirty industries, including semiconductor, battery and energy storage, electronics, and medical devices. The new demonstration facility will receive JEOL’s top-of-line electron microscopes and spectrometers over the coming months and will soon benefit clients across these sectors.

The partnership deepens JEOL’s presence in Silicon Valley and will expand Covalent’s capacity and capabilities offered. The demonstration facility will serve as a platform to research and highlight technologies and methods tailored for advanced material and device analysis. JEOL will work closely with Covalent’s team of experts to deepen understanding of the market’s analytical needs - informing JEOL’s development of next generation hardware, software, and applications research.

The Covalent and JEOL USA partnership delivers on their commitment to providing market access to advanced learning opportunities, and access to expertise and firsthand experience with cutting-edge instrumentation.  The partners will host a variety of demonstrations and educational events at the lab’s demonstration facility. JEOL’s commitment to providing Covalent experts access to the company’s newest instruments, ensures Covalent customers benefit from the most advanced instrumentation available.

Craig Hunter, Covalent Founder and CEO, commented, “JEOL has been a pioneer and leader in analytical instrumentation for 70 years. Their products are enabling some of the most exciting science and engineering happening around the world right now – work that is revolutionizing so many aspects of our modern society. We are honored that JEOL has chosen to partner in such a meaningful way with Covalent, and we are thrilled to house their Silicon Valley and West Coast demonstration lab here in Sunnyvale.”

Robert Pohorenec, President of JEOL USA, stated, “Covalent Metrology provides world-class expertise to a very diverse set of industries in order to solve very complex problems. They and their clients require state-of-the-art metrology and analytical instrumentation. Partnering with Covalent Metrology is an exciting opportunity for JEOL to expand awareness of JEOL’s technology in the industries served by Covalent and it will provide us deeper insight into the needs of researchers and industries that both our organizations desire to serve.”


For Media inquiries regarding Covalent Metrology please contact:  
Shannon Scheiwiller, Chief Marketing Officer,

About Covalent Metrology
Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.
Covalent now has over 500 customers in 30+ industries.
Learn more at:

atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures

Researchers Achieve Extraordinary Spatial Resolution for In-situ Atomic Resolution TEM Using New Luminary Micro Technique

Materials science researchers in Japan have achieved extraordinary in-situ Transmission Electron Microscope (TEM) experiments using a new Luminary Micro laser technique. They succeeded in recording atomic-resolution in-situ movies of growing carbon nanotubes and onion-shaped carbon nano structures. The structures were formed by laser irradiation of samples made of carbon films and iron nanoparticles.

This experiment was conducted using a JEOL 300kV Transmission Electron Microscope with a cold field emission gun, JEM-ARM300F, and a new system designed by JEOL subsidiary Integrated Dynamic Electron Solutions, Inc. for precisely focusing lasers onto TEM samples, Luminary Micro. This combination of high-performance imaging instrumentation and reduced sample motion due to precision-controlled rapid localized illumination enables extraordinary spatial resolution for in-situ experiments.

The research group consists of Dr. Ryousuke Senga, Electron Microscopy Group, Nanomaterials Research Institute, Advanced Industrial Science and Technology (AIST) and Professor Kazutomo Suenaga, Department of Nanocharacterization for Nanostructures and Functions, Nanoscience and Nanotechnology Center, The Institute of Scientific and Industrial Research (ISIR: SANKEN), Osaka University.

The details of this research will be presented by Dr. Senga during the Microscopy and Microanalysis (M&M) 2021 Conference, held in the U. S. from the first to the fifth of August 2021.

M&M 2021 Poster Presentation (online)

Poster Title: In-situ TEM observation of the growth process of carbon nanomaterials by laser irradiation
Presenter: Dr. Ryosuke Senga et al.
Poster Presentation Number: 787

Symposium: P01.P2 - Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Symposium Date: Wednesday, August 4, 2021
Symposium Time: 4:30 PM - 6:00 PM EST (US Eastern Standard Time)

JEOL acquired IDES, the leader and pioneer in the field of Ultrafast and Dynamic TEM, specializing in pulsed lasers and high-speed electrostatic beam blanking and deflection technologies, in 2019. IDES’ products add time resolution to the TEM's exceptional spatial resolution enabling new applications and the exploration of the dynamics of specimens across a range of very fast time scales.

Visit for more details. To learn more about JEOL-IDES Luminary Ultrafast TEM/Dynamic TEM and Luminary Micro, visit


JEOL and SCiLS Sign a Distribution Agreement for SCiLS Lab MVS Software

JEOL Ltd. and SCiLS, a division of Bruker Daltonics, announced that they have concluded a non-exclusive, worldwide distribution agreement for SCiLS Lab MVS software.

The SCiLS Lab has been the software of choice for researchers wanting to gain new insights from mass spectrometry imaging. Used in science and industry, the software sets new standards in analysis and visualization, simplifying everyday work and advancing the research. The SCiLS Lab MVS (Multi-Vender Support) can be used for the analysis of mass spectrometry imaging datasets based on the open imzML data format. SCiLS Lab MVS offers all features of SCiLS Lab and it allows the statistical analysis and visualization of mass spectrometry imaging data of virtually unlimited size in two and three spatial dimensions.

"We're very excited to work with JEOL to jointly disseminate the technology of mass spectrometry imaging and to support JEOL’s further development of their MALDI imaging solution ," Dennis Trede, co-founder of SCiLS and Director at Bruker Daltonics commented. "SCiLS Lab MVS – our software package for vendor-agnostic data analysis – offers the broadest possible compatibility for mass spectrometry imaging data of all vendors. The software enables to easily convert data into knowledge irrespective of which mass spectrometers the data come from."

“We are excited to offer SCiLS lab MVS software through our own sales channels,” said Yoshihisa Ueda, general manager of the mass spectrometry business unit of JEOL Ltd. “Highly sophisticated statistical analysis capability of SCiLS Lab MVS will benefit our SpiralTOF™-plus users considerably as they can now take full advantage of high mass-resolving power of SpiralTOF™-plus for their imaging MS researches.”

About SCiLS:

SCiLS was founded in 2010 as a spin-off from the University of Bremen to develop and promote mathematical and computational software solutions for mass spectrometry imaging. Since 2017, SCiLS has been part of Bruker Corporation.

24 Hours of Life Science Conference

On June 2, 2021, JEOL will focus on advances in life science research using electron microscopy in its “24 Hours of Life Science” conference. Twenty-four different sessions throughout the full day will cover topics including:

- Connectomics and the study of complete volumes of tissues or materials captured at high resolution
- Correlative microscopy using light microscopy and scanning electron microscopy to collect large areas of TEM-like data at multiple depths, overcoming the challenge of small sample size and hindered fields of view
- Direct Electron DE64 as a platform for automated cryo-electron microscopy
- Exploring TEM phenomena from milliseconds to femtoseconds
- Sub-2Å structures with CryoEM: from holes to hydrogens
- Elucidating novel crystalline structures with Electron and NMR crystallography
- NMR in the pharmaceutical industry

Noted researchers in their field of expertise are scheduled to present and discuss their topics throughout the day, with interactive sessions. Attendees will be able to participate in any of the sessions that they choose.

The event is hosted by JEOL’s headquarters in Germany, and facilitated with the participation of JEOL USA. To share in the most current ideas and solutions using electron microscopy in the life sciences, researchers worldwide are invited to participate in JEOL Germany’s MICROCOM II event, featuring a community of scientists from Europe and the United States on the frontline of research. Register at this link for access to the live event on the MICROCOM II platform.

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