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Documents of interest in support of your JEOL product

A Guide to Scanning Microscope Observation

We included in this book as many application examples as possible so that they can be used as criteria for judging what causes unsatisfactory image factors (hereinafter referred to as image disturbances). Although this edition does not describe all about image disturbances, it carries application photos to allow you to consider their causes. It is also important to correctly select the optimum observation conditions for various specimens. For instance, this book carries matters which are considered to be useful for using the instrument, such as the accelerating voltage, probe current and working distance (hereinafter abbreviated to WD).

Air Isolated Transfer System

There are a number of applications where scientists and engineers are faced with air or moisture sensitive samples that require imaging and analysis using a scanning electron microscope (SEM). Applications include: components in rechargeable batteries, fuel cells, and catalysts among others. Any exposure to oxygen or moisture in the air can completely alter or destroy the structure of these highly reactive materials. JEOL has built a special air-lock system that can handle the transfer of air-sensitive specimens to be imaged in the SEM without atmospheric exposure.

Aperture Angle Control Lens

The ability to increase the probe current for fast microanalysis, while still maintaining a small spot size and small volume of excitation for high resolution, has been the holy grail of microanalysis in SEM. One of the unique features of JEOL’s FE-SEMs is the patented Aperture Angle Control Lens (ACL). This lens automatically optimizes for both high resolution imaging at low probe currents and high spatial resolution X-ray analysis at high probe currents with a seamless transition between the two.

Atomic resolution structure results from the JEOL 200 kV CRYO ARM™ TEM

High resolution structure determination by electron cryo-microscopy (cryoEM) and Single Particle Analysis (SPA) has progressed to the point where structures can be determined routinely to better than 3Å on a 300 kV microscope. Pioneering efforts have shown that similar results can also be achieved on 200 kV platforms. Similarly, efforts are underway to allow for a structure determination within a single day or even less. Here, we show results from Merk et al. at NIH from the JEOL CRYO ARM™ 200 obtained on beta-galactosidase at 1.8Å resolution1. The 3D map shows surprising details in the map reflecting the high resolution quality of the data.

Atomic resolution structure results from the JEOL 300 kV CRYO ARM™ TEM

High resolution structure determination by electron cryo-microscopy (cryoEM) and Single Particle Analysis (SPA) has progressed to the point where structures can be determined routinely to better than 2Å on a 300 kV microscope. Here, we show results from Kato et al. at1 Osaka University from the JEOL CRYO ARM™ 300 installed at SPring8 (Riken, Japan), that was obtained on mouse heavy chain apo-ferritin at 1.5Å resolution. The 3D map shows surprising details in the map reflecting the high resolution quality of the data.

Atomic resolution structures of biological macromolecules using microED on JEOL TEMs

Micro electron diffraction, or microED, is a technique aimed at solving structures of biological macromolecules by electron diffraction. Barn-storming work by the group from Prof. Gonen showed the impressive impact and promise of this technique1. The technique borrows from X-ray crystallography in that precession techniques are used for data collection and that much of the well-established software for solving structures by X-ray crystallography can be used for microED. However, it differs in a fundamental way in that electrons are used, which, owing to the substantially larger scattering cross-section of electrons with biological matter, means much smaller crystals can be used.

Other Resources

The following resources are available concerning Electron Optic related instruments:

  • Image Gallery
    -View a selection of electron images
  • FAQs
    -See answers from questions often asked about our SEM and Surface Analysis instruments
  • Links & Resources
    -View our page of useful and interesting links to various electron microscopy resources
  • Videos
    -View some product presentations of our instruments
  • SEM Theory and SEM Training

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