JEOL USA Press Releases

GRAND ARM Transmission Electron Microscope - JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI)

Renowned Materials Scientists to Present at the 1st International Symposium on Advanced Microscopy and Spectroscopy (ISAMS)

April 18, 2018 – Peabody, Mass. ---- World-renowned electron microscopists will join Dr. Xiaoqing Pan, Director of the University of California Irvine Materials Research Institute (IMRI), for the Grand Opening of the JEOL Center for Nanoscale Solutions and a three-day symposium June 6-8, 2018.

The JEOL Center for Nanoscale Solutions at IRMI is poised to become one of the world’s preeminent centers of excellence for interdisciplinary research, discovery and development of engineered and natural materials, systems and devices. IMRI is home to several of the highest performance TEMs available in the world today. It is also the first US installation of the JEOL GRAND ARM Transmission Electron Microscope developed for advanced atomic resolution characterization,  In addition, the facility also houses the JEM-2800 high throughput, nano-analysis TEM/STEM, and the JEM-2100F cryogenic and atomic level structural analysis TEM.

The Grand Opening will showcase the accomplishments to date at this premier Transmission Electron Microscopy (TEM) facility, now open to serve all university, industry and nonprofit researchers. Invited speakers will include leading edge researchers in electron microscopy who are known worldwide for their achievements in materials and biological sciences.

The interdisciplinary nexus for the study and development of new materials, IMRI operates a wide range of state-of-the-art, open-access user facilities for the characterization of materials, biological samples and devices from sub-Å to macroscopic length scales - available to all university, industry and non-profit researchers. It offers advanced techniques and services with professional staff support.

JEM-2100F Transmission Electron Microscope -  JEOL Center for Nanoscale Solutions at California Irvine Materials Research Institute (IMRI)

Dr. Pan, an internationally-recognized researcher in the physics of materials, joined the UC Irvine faculty in 2015 to lead the $20 million initiative. According to Dr. Pan, “The three-day symposium will bring together the scientific community working on various aspects of research and development in TEM to encourage the exchange of ideas for the advancement and challenges in atomic scale imaging and spectroscopy. There will be over 50 internationally renowned TEM experts and scientists participating in this event.”

In his work Pan has pioneered the development and applications of advanced TEM techniques and the discovery of novel phenomena and properties of engineered materials, which range from ferroelectrics and multiferroics to nanocatalysts and energy materials.

“The JEOL Center for Nanoscale Solutions will be the most advanced electron microscopy cluster available for probing the atomic structure and properties of materials," says JEOL USA President Peter Genovese.

The Scottish Cryo-EM consortium has chosen the JEOL JEM-Z300FSC CRYO ARM™ 300 as their preferred automated Cryo Transmission Electron Microscope (Cryo-TEM) for the Scottish Centre for Macromolecular Imaging (SCMI).

Further information: JEOL UK press release

Also See:

CRYO ARM™ 200 Field Emission Cryo-electron Microscope
CRYO ARM™ 300 Field Emission Cryo-electron Microscope

Six teams with captains wearing hand decorated chefs hats were able to collect 6,111 pounds of food to donate from JEOL to the local food pantry.)

November 15, 2017 – Peabody, Mass. ---- The spirit of giving is getting competitive at JEOL USA headquarters in Peabody, Mass. JEOL employees were challenged to a food drive to support Haven from Hunger. Six teams competed for the heaviest donations – filling boxes with food staples that collectively weighed three tons.

The employees pitched in to load the Haven from Hunger truck that arrived for pickup the morning of Wednesday, November 15, and help unload it at the food pantry also located in Peabody. Haven from Hunger provides food to over 1,800 needy households and last year provided over 600,000 meals.

The Executive Director of Citizens Inn, which merged with Haven from Hunger this year, Corey Jackson, was on hand to help load the boxes, which took over a half hour. “This is incredible, we didn’t expect so much!” he said.  “This is one of the largest corporate food drives we’ve ever seen.”

JEOL employees loaded the food pantry truck and helped unload it when it reached its destination. 

JEOL USA takes its community service seriously, encouraging employees to volunteer for 8 hours each year during the work hours. Recent community service activities include painting bowls for Haven for Hunger’s Empty Bowl dinner, providing and carving pumpkins used at Massachusetts Audubon Ipswich River Wildlife’s Haunted Happenings fundraiser, and its annual “Adopt a Family” holiday giving to two local families in need.

“At our US corporate headquarters in Peabody our employees work to make a positive influence in our community,” says Director of Human Resources, Collette Hanlon. “This is kind of crazy, never in a million years did I expect this amount of food to be donated by our employees.”

To step up the food donation drive, JEOL offered the winning team a coveted prize: the opportunity to “dress down” and wear jeans and sneakers to work for a week.

JEOL employees loaded the food pantry truck and helped unload it when it reached its destination. 

“We’re happy that we’re able to make some small impact on people’s lives that need our help, especially at this time of year. I’m amazed we were able to get three tons of food and I’m proud of all the employees banding together,” said JEOL USA President Pete Genovese.

A scientific instrument company with global headquarters in Japan, JEOL USA has been located at the Peabody site since the 1970s and employs approximately 110 people at this location, with another 200 employed throughout North and South America.

(August 24, 2017 – Peabody, Mass.)  JEOL USA has produced a new MALDI imaging technical applications note that describes the unique analytical process for a variety of biological and organic samples. MALDI imaging is a powerful mass spectrometry technique available with JEOL’s MALDI Imaging SpiralTOF. It is used to assess the distribution of proteins, peptides, lipids, drugs, and metabolites in tissue specimens, as well as compound distribution in organic materials. MALDI is an acronym for matrix-assisted laser desorption/ionization mass spectrometry.

JEOL’s MALDI Imaging SpiralTOF Mass Spectrometer offers unique capabilities that include imaging of samples with irregular surfaces.  In a conventional reflectron time-of-flight mass spectrometer, the flight time is influenced by small changes in the target position.  To maintain high mass-resolving power across an entire sample, the sample must be perfectly flat.  However, it is impossible to achieve a perfectly flat surface for real-world samples.  Because small variations in the sample surface are only a tiny fraction of the SpiralTOF’s 17-meter flight path, it is possible to maintain high mass-resolving power for the entire image.  This is critical if you need to know the accurate spatial distribution of a specific compound without interference from background interferences.

High-resolution mass spectra are collected for the entire image in each of the examples ranging from lipids in mouse brain tissue to Organic Electroluminescent Panels and laser desorption ionization of ballpoint inks. 

The full-color applications note is available for free download at go.jeolusa.com/MALDI. More than a dozen application-specific notes are also available on specific MALDI imaging applications on the JEOL website at www.jeolusa.com.

For further information, please visit https://www.jeol.co.jp/en/products/detail/JSM-IT500HR.html.

August 1, 2017 (Peabody, Mass.) -- A new JEOL technical note, "Structure Elucidation of Fluorinated Compounds by NMR," describes the technology and applications of the new JEOL ROYAL HFX probe for Nuclear Magnetic Resonance (NMR) Spectroscopy.

The JEOL ROYAL HFX NMR probe offers a new level of flexibility for NMR analysis of fluorinated compounds prevalent in wide variety of current products and many new products across a wide spectrum of industries.

The paper is available for download at this link: http://bit.ly/2uSFWXc

June 15, 2017, Peabody, Mass. -- The JEOL InfiTOF compact high-resolution gas analysis mass spectrometer is ideal for monitoring trace impurities in semiconductor process gases, evolved gases from catalytic reactions, vapor epitaxy and more.  No larger than a desktop PC, the InfiTOF instantly separates isobaric gases such CO and N₂, or N₂O and CO₂, for continuous monitoring without chromatography. 

This Time-of-Flight Mass Spectrometer uses Multi-turn and Perfect focusing technologies to achieve high mass-resolving power in a very compact package.

Designed for real time monitoring of directly introduced gas, this high mass-resolution mass spectrometer features stability for real time gas monitoring and elemental composition determination through accurate mass measurement. 

On July 11-13, the InfiTOF will be on display at Semicon West in San Francisco, CA, where its applications to the analysis of gases used in semiconductor processing and vapor epitaxy and real-time monitoring of gases relevant to catalytic processes, battery technology and advanced materials will be highlighted.

(June 1, 2017 - Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of metals, magnetic materials, semiconductors, ceramics, medical devices, and biological specimens.

Advanced research and analysis requires ever more powerful capabilities in a flexible, easy-to-use instrument. This new SEM features new functions and software to make the power of the Field Emission SEM accessible to all levels of users, from the experienced researcher to novice operator.

At the heart of this cutting-edge microscope is the new electron optical system, NeoEngine, that significantly enhances alignment accuracy, optimizes probe diameter at all conditions, and simplifies observation for all levels of operators   

A powerful new navigation system, Smile Navi, guides the operator through the data acquisition process. The novice can master basic SEM operation steps and an online training guide provides comprehensive support.

The new FE SEM delivers ultimate performance with innovative standard features that include:

• High sensitivity BE detector providing exceptional performance at low accelerating voltages
• Ultralow kV in-lens detectors
• GBSH-S (GENTLEBEAM™ Super High mode) enabling high resolution imaging at extremely low accelerating voltages (down to 10V)
• Super Hybrid Lens (SHL), a combination of electrostatic and electromagnetic lenses, to support ultra high resolution imaging and analysis of various samples ranging from magnetic materials to insulators.
• A new sample exchange system is designed to change samples in a safe, speedy, seamless manner through simple operation.

The JSM-7900F features an In-lens Schottky Plus field emission electron gun. Enhanced integration of the gun and low aberration condenser lens provides higher levels of brightness. Ample probe current is available at low accelerating voltage, supporting various applications from high resolution imaging to high speed elemental mapping.

Designed to accommodate multiple analytical tools, the JSM-7900F is a virtual nanolab for a wide range of application demands. 

May 16, 2017 (Peabody, Mass.) -- Since 1967, JEOL has been the industry leader in Electron Beam Lithography design and manufacturing. Now the company enters its 51st year in this field with the introduction of a new high throughput spot beam direct write system, the JBX-8100FS.

This new generation of e-beam introduces the capability of writing ultrafine patterns at a high rate of speed directly onto substrates with minimum idle time during the exposure process. Maximum scanning speed has been increased to 125 MHz (the world’s highest level) for high speed writing applications.

The JBX-8100FS features two exposure modes to support a range of patterning options, from ultra fine processing to faster throughput for small-to-mid-size production. The tool allows rapid development of integrated circuit patterns for prototypes or high volume manufacturing.

Direct write electron beam lithography can be used to quickly write integrated circuit patterns with feature sizes guaranteed less than 10 nm onto a variety of substrate materials, and for superior pattern stitching of +/- 9nm or less in high throughput mode, or +/-20nm or less in high throughput mode. The high-precision stage accommodates substrates ranging from 200 mm diameter wafers down to small pieces.  

The new system's small, compact footprint and low power consumption reduce cost of ownership. All JEOL e-beam systems are supported by the company's dedicated service engineers.

Birck Nanotechnology Center, Purdue University, to be first US installation

JEOL USA will install the first JBX-8100FS in North America at the Birck Nanotechnology Center, Purdue University, under the direction of Ali Shakouri and Dimitrios Peroulis. The interdisciplinary research center provides infrastructure for 160 affiliated faculty members and their research groups. The 186,000 sq ft. facility includes a 25,000 sq. ft. ISO Class 3-4-5 (Class 1-10-100) nanofabrication cleanroom.

Learn more about the new JBX-8100FS.

Ultrahigh resolution imaging of large samples in their native state

May 11, 2017 -- Peabody, MA JEOL USA introduces a new Scanning Electron Microscope (SEM) that combines the performance of a Field Emission SEM with the simplicity of the JEOL InTouchScope SEM series. The new JSM-IT300HR features exceptional image fidelity at any kV with a high brightness, long life emitter.

Offering higher resolution and magnification than ever before in this series, the IT300HR greatly enhances surface topography and contrast.

A rugged in-chamber specimen stage and large chamber accommodate a wide variety of samples of different shapes, sizes, and weights, enabling users to secure large, heavy and odd shaped objects on the stage with clear positioning prior to evacuating the chamber.

The specimen chamber’s twelve geometrically-optimized analytical ports allow for multiple detectors, creating a virtual nano-lab inside the SEM. Low vacuum capability is a standard feature and allows for imaging and analysis of all types of samples in their native state.  When configured with a JEOL EDS detector, fast analysis is done directly within the  SEM software interface.

InTouchScope™ series SEMs are designed to make operation intuitive, and controlled through touchscreen interface using multi-touch gestures and/or traditional keyboard/mouse and operation panel.  A ‘Navi’ mode guides operation from sample introduction to automatic condition setting for new or occasional users.

"As a global leader in scanning electron microscopy for over 50 years, we’ve just changed the rules of the game," says Donna Guarrera, Asst. Director, SM Division, JEOL USA. "The JSM-IT300HR provides field emission performance on a very flexible but easy to use platform within a tungsten SEM’s price range."