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JEOL Guide to Scanning Microsocope Observation

 > Electron Optics  > Scanning Electron Microscope (SEM)

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To help make correct judgments while imaging, the first edition of "A Guide to Scanning Microscope Observation" was published and it has since been used by a great many people. Today, after several years since the publication of the first edition, and with instrumental improvements, some parts of the edition need amendment. This is the reason why we bring this revised edition to you.

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